Michelson Interferometer
IFS2-MI-25
A basic shape interferometer used for observing surface accuracy of reflection samples.
It is characterized by two optical paths deflected orthogonally by the reflector.
The difference between the surface shapes of the reflectors installed in each optical path can be observed as distortion of fringes.
It is characterized by two optical paths deflected orthogonally by the reflector.
The difference between the surface shapes of the reflectors installed in each optical path can be observed as distortion of fringes.
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IFS2-MI-25
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A basic shape interferometer used for observing surface accuracy of reflection samples.
It is characterized by two optical paths deflected orthogonally by the reflector.
The difference between the surface shapes of the reflectors installed in each optical path can be observed as distortion of fringes.
It is characterized by two optical paths deflected orthogonally by the reflector.
The difference between the surface shapes of the reflectors installed in each optical path can be observed as distortion of fringes.
